GaN laser diodes for quantum sensing, precision metrology, and quantum computing

A. Kafar; S. P. Najda; P. Perlin; T. Suski; S. Stanczyk; M. Leszczyński; T. Slight; S. Gwyn; S. Watson; A. E. Kelly; M. Knapp; M. Haji

doi:10.1117/12.2691756

13 March 2024 GaN laser diodes for quantum sensing, precision metrology, and quantum computing

A. Kafar, S. P. Najda, P. Perlin, T. Suski, S. Stanczyk, M. Leszczyński, T. Slight, S. Gwyn, S. Watson, A. E. Kelly, M. Knapp, M. Haji

Author Affiliations +

Proceedings Volume 12912, Quantum Sensing, Imaging, and Precision Metrology II; 129120Z (2024) https://doi.org/10.1117/12.2691756
Event: SPIE Quantum West, 2024, San Francisco, California, United States

Abstract

Quantum technologies containing key GaN laser components will enable a new generation of precision sensors, optical atomic clocks and secure communication systems for many applications such as next generation navigation, gravity mapping and timing since the AlGaInN material system allows for laser diodes to be fabricated over a wide range of wavelengths from the U.V. to the visible. We report our latest results on a range of AlGaInN diode-lasers targeted to meet the linewidth, wavelength and power requirements suitable for quantum sensors such as optical clocks and cold-atom interferometry systems. This includes the [5s²S_1/2-5p²P_1/2] cooling transition in strontium⁺ ion optical clocks at 422 nm, the [5s₂¹S₀-5p¹P₁] cooling transition in neutral strontium clocks at 461 nm and the [5s² s_1/2– 6p²P_3/2] transition in rubidium at 420 nm. Several approaches are taken to achieve the required linewidth, wavelength and power, including an extended cavity laser diode (ECLD) system and an on-chip grating, distributed feedback (DFB) GaN laser diode.

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A. Kafar, S. P. Najda, P. Perlin, T. Suski, S. Stanczyk, M. Leszczyński, T. Slight, S. Gwyn, S. Watson, A. E. Kelly, M. Knapp, and M. Haji "GaN laser diodes for quantum sensing, precision metrology, and quantum computing", Proc. SPIE 12912, Quantum Sensing, Imaging, and Precision Metrology II, 129120Z (13 March 2024); https://doi.org/10.1117/12.2691756

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