Error analysis based on the technology of multiple sub-band signal splicing in range direction

Dekun Li; Bin Li; Xing Sun; Dongjuan Han; Rumeng Liu; Xiaoqiang Zhang

doi:10.1117/12.3017528

15 January 2024 Error analysis based on the technology of multiple sub-band signal splicing in range direction

Dekun Li, Bin Li, Xing Sun, Dongjuan Han, Rumeng Liu, Xiaoqiang Zhang

Author Affiliations +

Proceedings Volume 12983, Second International Conference on Electrical, Electronics, and Information Engineering (EEIE 2023); 1298314 (2024) https://doi.org/10.1117/12.3017528
Event: Second International Conference on Electrical, Electronics, and Information Engineering (EEIE 2023), 2023, Wuhan, China

Abstract

Larger transmitting bandwidth is needed to get range direction high-resolution imaging in Synthetic Aperture Radar (SAR) system. Though, large bandwidth signal faces many problems on techniques and methods. Multiple sub-band signal splicing technique is used to produce large bandwidth signal to gain high-resolution images. Influenced by hardware in engineering, the amplitude, time and phase of each sub-band are different. The performance of sub-band splicing is affected by those differences. Error analysis on sub-band splicing is brought by different simulation with different amplitude, time and phase. The simulation results demonstrate varying degrees of deterioration in range direction PSLR and ISLR when the different amplitude, time and phase are used.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Dekun Li, Bin Li, Xing Sun, Dongjuan Han, Rumeng Liu, and Xiaoqiang Zhang "Error analysis based on the technology of multiple sub-band signal splicing in range direction", Proc. SPIE 12983, Second International Conference on Electrical, Electronics, and Information Engineering (EEIE 2023), 1298314 (15 January 2024); https://doi.org/10.1117/12.3017528

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