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In this contribution we show encouraging results of photo-induced thermal emission measurements, in nanosecond regime, for metallic layers and multilayers. The experimental setup of the instrument is presented. A comparison with the results given by numerical simulation is also highlighted, which allows to estimate the thermal parameters of thin films.
François Thullier,Myriam Zerrad,Claude Amra, andHélène Krol
"Development of an experimental facility for the measurement of photo-induced thermal emission in interferential filters", Proc. SPIE 13020, Advances in Optical Thin Films VIII, 130200A (24 June 2024); https://doi.org/10.1117/12.3017381
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François Thullier, Myriam Zerrad, Claude Amra, Hélène Krol, "Development of an experimental facility for the measurement of photo-induced thermal emission in interferential filters," Proc. SPIE 13020, Advances in Optical Thin Films VIII, 130200A (24 June 2024); https://doi.org/10.1117/12.3017381