Selecting materials for short-period multilayer x-ray mirrors: comparison between peak and integrated reflectivity

Corentin Nannini; Nolann Ravinet; Antoine Lejars; Evgueni Meltchakov; Franck Delmotte

doi:10.1117/12.3016698

24 June 2024 Selecting materials for short-period multilayer x-ray mirrors: comparison between peak and integrated reflectivity

Corentin Nannini, Nolann Ravinet, Antoine Lejars, Evgueni Meltchakov, Franck Delmotte

Author Affiliations +

Proceedings Volume 13020, Advances in Optical Thin Films VIII; 130200X (2024) https://doi.org/10.1117/12.3016698
Event: SPIE Optical Systems Design, 2024, Strasbourg, France

Conference Poster

Abstract

Based on our simulations, we have developed a systematic approach to identifying suitable materials for short-period multilayer mirrors operating at 30 keV. We tested many materials and evaluated the performance of each possible combination, focusing on two key figures of merit: integrated reflectivity and peak reflectivity. While it is typical to optimize a multilayer structure to maximize the peak reflectance, we found that this approach can lead to bias. Instead, we propose using integrated reflectivity as a more robust criterion for material selection. Our results demonstrate the effectiveness of this approach in identifying high-performance multilayer mirrors for x-ray applications.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Corentin Nannini, Nolann Ravinet, Antoine Lejars, Evgueni Meltchakov, and Franck Delmotte "Selecting materials for short-period multilayer x-ray mirrors: comparison between peak and integrated reflectivity", Proc. SPIE 13020, Advances in Optical Thin Films VIII, 130200X (24 June 2024); https://doi.org/10.1117/12.3016698

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