PROCEEDINGS VOLUME 13079
3RD INTERNATIONAL CONFERENCE OF TESTING TECHNOLOGY AND AUTOMATION ENGINEERING (TTAE 2023) | 15-17 SEPTEMBER 2023
Third International Conference on Testing Technology and Automation Engineering (TTAE 2023)
Editor(s): Zain Anwar Ali, Inès Chihi
Editor Affiliations +
3RD INTERNATIONAL CONFERENCE OF TESTING TECHNOLOGY AND AUTOMATION ENGINEERING (TTAE 2023)
15-17 September 2023
Xi-an, China
Front Matter: Volume 13079
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307901 (2024) https://doi.org/10.1117/12.3029027
Intelligent Instrument and Precision Monitoring Technology
Min Fan, Hanghang Zhao, Mingjie Lin, Weixin Liang, Peiliang Jia, Qi Guo
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307902 (2024) https://doi.org/10.1117/12.3015403
Wenhao Xing, Aimin Wang, Jiayu Zhang, Baode Xu, Yuan Yu
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307903 (2024) https://doi.org/10.1117/12.3015580
Zhihe Wu, Qingsheng Feng
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307904 (2024) https://doi.org/10.1117/12.3015684
Yuanli Qin, Ningning Zhao, Yulong Feng, Shaolin Zhao
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307905 (2024) https://doi.org/10.1117/12.3015679
Ying Lin, Yihang Ma, Chenxin Hu, Jiakang Zhang, Boqing Xie, Yingjun Xie
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307906 (2024) https://doi.org/10.1117/12.3015397
Pengwei Mei, Weigu Hao, Xiajie Jin
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307907 (2024) https://doi.org/10.1117/12.3015661
Peng He, Junhao Lv, Jinyou Xiao, Ping Ren, Liqiang Wang, Lei Zu
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307908 (2024) https://doi.org/10.1117/12.3015379
Li Chen, Yanpeng Feng, Keqin Ding
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307909 (2024) https://doi.org/10.1117/12.3015413
Yunnan Li, Xiaolei Shi, Songyang Jiang, Peng Zhou
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790A (2024) https://doi.org/10.1117/12.3015384
Xiangrui Yang, Mengdie Xiang, Cai Wang, Shanlin Wen, Zhonghao Wang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790B (2024) https://doi.org/10.1117/12.3016116
Yaohong Wang, Zhongmu Zhou, Cai Wang, Shanlin Wen, Tingting Ren
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790C (2024) https://doi.org/10.1117/12.3015467
Zhaokai Xing, Fang Wu, Rongyuan Hu, Guobin Xu, Hongjun Xie, Shaohua Fan, Shanshan Wang, Jinfeng Yang, Lin Meng, et al.
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790D (2024) https://doi.org/10.1117/12.3015601
Yining Wang, Yuan Li, Wenxiang Chen, Tiangang Jin, Faxin Zhu, Jinyuan Li
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790E (2024) https://doi.org/10.1117/12.3015477
Jiani Shen, Xuan Wang, Yong Zhu, Tingting Yang, Xihan Yang, Lansen Li, Junfa Deng, Wanjun Jiang, Xin Li
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790F (2024) https://doi.org/10.1117/12.3016024
Zhaoqing Li
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790G (2024) https://doi.org/10.1117/12.3016141
Hui Shen, Gaili Gao, Shaohuan Fan, Zhijie Liu
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790H (2024) https://doi.org/10.1117/12.3015805
Mingxiang Chen, Huanyu Liu, Mengyang Gao, Yu Wang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790I (2024) https://doi.org/10.1117/12.3015382
Yunbo Zhang, Shuo Li
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790J (2024) https://doi.org/10.1117/12.3015537
Guangrui Yin, Chen Liu, Zhiyuan Li
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790K (2024) https://doi.org/10.1117/12.3015454
Xiaolong Li, Jinzhong Chen, Xuyun Yang, Renyang He, Tao Meng
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790L (2024) https://doi.org/10.1117/12.3015428
Xiaolong Li, Xiao Li, Xuyun Yang, Jiwang Zhang, Tao Meng, Jinzhong Chen, Renyang He
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790M (2024) https://doi.org/10.1117/12.3015422
Hongxing Guo, Wenqiang Zhang, Huadong Song, Yanli Zeng, Xiaoting Guo, Zhiheng Chen
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790N (2024) https://doi.org/10.1117/12.3015378
Intelligent Machinery Manufacturing and Automation Control
Jianzhong Qiu, Jun Wu, Xi Chen, Yanjin Liu
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790O (2024) https://doi.org/10.1117/12.3015348
Yating He, Xiaoyan Ji, Rui Zhao, Weilin Xu, Jialu Long
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790P (2024) https://doi.org/10.1117/12.3015550
Yan Zhang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790Q (2024) https://doi.org/10.1117/12.3015442
Zhao Liu, Aimin Wu, Tao Wu, Xuegang Guo, Xiuwei Ma, Xin Gao
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790R (2024) https://doi.org/10.1117/12.3015583
Zhijia Liu, Xin Xu, Yongqiang Hu, Jiang Qin, Xiangbo Fu, Linlin Li
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790S (2024) https://doi.org/10.1117/12.3015892
Xiaolei Shi, Yunnan Li, Jianzhong Ji, Baobing Ren
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790T (2024) https://doi.org/10.1117/12.3015570
Lili Fan, Jian Wang, Zhiyu Chen
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790U (2024) https://doi.org/10.1117/12.3015399
Mengqi Zhang, Hao Sun, Xinrong Li, Xuecheng Sun
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790V (2024) https://doi.org/10.1117/12.3015525
Anfeng Jiang, Yingying Zhao, Lei Su, Wenrong Si, Yue Tian, Yubo Fan
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790W (2024) https://doi.org/10.1117/12.3015579
Junjun Chen, Zaojun Fang, Dexin Jiang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790X (2024) https://doi.org/10.1117/12.3015498
Wanting Wang, Siming Wang, Taoguo Han
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790Y (2024) https://doi.org/10.1117/12.3015392
Ya Ban, Pengzhen Hong, Zhiyong Luo
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130790Z (2024) https://doi.org/10.1117/12.3015530
Huanyu Liu, Mingxiang Chen, Mengyang Gao, Yu Wang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307910 (2024) https://doi.org/10.1117/12.3015394
Yaohong Wang, Xin Chen, Hailong Song, Tingting Ren, Zhonghao Wang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307911 (2024) https://doi.org/10.1117/12.3015456
Mengyang Gao, Huanyu Liu, Mingxiang Chen, Yu Wang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307912 (2024) https://doi.org/10.1117/12.3015424
Hanyu Zhang, Yuntao Li, Zitong Zhang, Yanan Jiang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307913 (2024) https://doi.org/10.1117/12.3015585
Yuntao Li, Hanyu Zhang, Yanan Jiang, Zitong Zhang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307914 (2024) https://doi.org/10.1117/12.3015587
Wen-Bo Yang, Bin Yu, Cheng Huang, Jian Tian, Yan-Hui Hou, Sen-Dong Gu, Yu Tian, Yan-Long Ma, Xi-Long Wang, et al.
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307915 (2024) https://doi.org/10.1117/12.3015444
Weilin Li, Yangming Jiang, Ting Lin, Xu Cheng, Tianshu Zhao, Ting Liu, Zhongjie Zhang, Feng Chen
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307916 (2024) https://doi.org/10.1117/12.3015524
Hongzhen Wang, Shuang Li
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307917 (2024) https://doi.org/10.1117/12.3015380
Yingjie Huang, Qiang Fu
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307918 (2024) https://doi.org/10.1117/12.3015441
Tingting Fang, Zhenfeng Cao, Minglai Yang
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 1307919 (2024) https://doi.org/10.1117/12.3015572
Ze Cao, Fucong Liu, Bing Yan
Proceedings Volume Third International Conference on Testing Technology and Automation Engineering (TTAE 2023), 130791A (2024) https://doi.org/10.1117/12.3015354
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