The Short-Wave Infrared (SWIR) spectrum reveals distinct optical properties of many materials which considerably differ from their properties in the visible spectrum, creating unique imaging opportunities. SWIR imaging is usually done with InGaAs focal plane arrays which due to their low-volume manufacturing and high price remain inaccessible for many applications. Image sensors based on Colloidal Quantum Dot (CQD) photodiodes recently emerged as alternative that has a potential to enable high-volume manufacturing of SWIR image sensors. Multiple images in distinct SWIR bands often need to be captured, but due to the unique properties of CQD photodiodes, it is challenging to directly integrate optical filters on top of them for the purposes of spectral imaging. Here, we propose a strategy to overcome these challenges by integrating CQD photodiodes on top of optical metasurfaces. Patterned silicon nanostructures enable detection of spectrally and polarization sensitive SWIR light. The proposed device stack is compatible with thin-film processing and demonstrates a path towards affordable spectral imaging in SWIR which can impact many industrial, scientific and consumer domains.
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