System response function: a new approach to minimize IR testing errors

Stephen W. McHugh; Dave A. Gallinger; Eden Y.C. Mei

doi:10.1117/12.21781

1 October 1990 System response function: a new approach to minimize IR testing errors

Stephen W. McHugh, Dave A. Gallinger, Eden Y.C. Mei

Proceedings Volume 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing; (1990) https://doi.org/10.1117/12.21781
Event: 1990 Technical Symposium on Optics, Electro-Optics, and Sensors, 1990, Orlando, FL, United States

Abstract

Thermal Imaging Systems are characterized by various tests such as Minimum Resolvable Temperature (MRT), System Intensity Transfer Function (SITF) and Noise Equivalent Temperature Differential (NETD). Numerous sources of errors can effect these test giving misleading results. These error sources are analyzed and a new correction methodology is presented.

Citation Download Citation

Stephen W. McHugh, Dave A. Gallinger, and Eden Y.C. Mei "System response function: a new approach to minimize IR testing errors", Proc. SPIE 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing, (1 October 1990); https://doi.org/10.1117/12.21781

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