Poster + Paper
27 August 2024 Toward a universal characterization methodology for conversion gain measurement of CMOS APS: application to Euclid and SVOM
J. Le Graët, A. Secroun, M. Tourneur-Silvain, E. Kajfasz, J.-L. Atteia, O. Boulade, A. Nouvel de la Flèche, H. Geoffray, W. Gillard, S. Escoffier, F. Fortin, N. Fourmanoit, S. Kermiche, H. Valentin, J. Zoubian
Author Affiliations +
Conference Poster
Abstract
With the expanding integration of infrared instruments in astronomical missions, accurate per-pixel flux estimation for near-infrared hybrid detectors has become critical to the success of these missions. Based on CPPM’s involvement in both SVOM/Colibri and Euclid missions, this study introduces universally applicable methods and framework for characterizing IR hybrid detectors and decorrelating their intrinsic properties. The characterization framework, applied to the ALFA detector and Euclid’s H2RG, not only validates the proposed methods but also points out subtle behaviors inherent to each detector.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
J. Le Graët, A. Secroun, M. Tourneur-Silvain, E. Kajfasz, J.-L. Atteia, O. Boulade, A. Nouvel de la Flèche, H. Geoffray, W. Gillard, S. Escoffier, F. Fortin, N. Fourmanoit, S. Kermiche, H. Valentin, and J. Zoubian "Toward a universal characterization methodology for conversion gain measurement of CMOS APS: application to Euclid and SVOM", Proc. SPIE 13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI, 131031W (27 August 2024); https://doi.org/10.1117/12.3020095
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KEYWORDS
Sensors

Quantum efficiency

Signal detection

Bias correction

CMOS sensors

Histograms

Infrared detectors

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