Presentation + Paper
27 August 2024 Studying amplifier glow in p-channel silicon MOSFETs using Skipper-CCDs
Santiago Perez, Javier Tiffenberg, Stephen Holland, Dario Rodrigues, Juan Estrada, Brenda A. Cervantes-Vergara, Guillermo Fernandez Moroni
Author Affiliations +
Abstract
We study the amplifier light emission of a set of MOSFET transistors with different Drain-Source to Gate (DS-G) distances using a dedicated Skipper-CCD sensor with single photon resolution. This light emission comes in the form of near-infrared photons produced on the Skipper’s readout stage by "hot electrons" generated in the output transistor. Depending on the applied voltages, this effect can be very faint generating only a few photons or produce a noticeable glow that can greatly impact the quality of the CCD images. A dedicated sensor with four output transistors and a different Drain-Source to Gate distance in each of them was specifically designed and fabricated at Teledyne/DALSA in order to study this phenomenon. Two different methods to characterize photons from the amplifier were explored. The first one takes advantage of the Skipper’s spatial resolution to study the total number of photons being emitted and how they propagate through silicon in the active area. The second one uses the single-electron counting mode of the device to measure the rate at which photons are emitted only in the readout stage.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Santiago Perez, Javier Tiffenberg, Stephen Holland, Dario Rodrigues, Juan Estrada, Brenda A. Cervantes-Vergara, and Guillermo Fernandez Moroni "Studying amplifier glow in p-channel silicon MOSFETs using Skipper-CCDs", Proc. SPIE 13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI, 131030H (27 August 2024); https://doi.org/10.1117/12.3019101
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Transistors

Charge-coupled devices

Silicon

Sensors

Electrons

Field effect transistors

CCD image sensors

RELATED CONTENT

InAsSb Hybrid Imager Evaluation
Proceedings of SPIE (May 07 1980)
Design and initial test results of a CCD fan out...
Proceedings of SPIE (September 29 2004)
Results of a fast pnCCD detector system
Proceedings of SPIE (August 25 2005)

Back to Top