A study on conducting filament formation in varying 3D memristive thin film using a phase-field model

Ambroise L. M. Juston; John F. Sevic; Nobuhiko P. Kobayashi

doi:10.1117/12.3029802

2 October 2024 A study on conducting filament formation in varying 3D memristive thin film using a phase-field model

Ambroise L. M. Juston, John F. Sevic, Nobuhiko P. Kobayashi

Proceedings Volume 13114, Low-Dimensional Materials and Devices 2024; 1311404 (2024) https://doi.org/10.1117/12.3029802
Event: Nanoscience + Engineering, 2024, San Diego, California, United States

Abstract

Experimental data suggests that multiple conductive filament (CF) formation in oxide-based memristive thin films depends on the film’s geometry. We used a computational phase-field model, without a priori model constraints, and studied the effects of the variation of geometry and dimensions in a three-dimensional sample on the formation of multiple conducting filaments and how they evolve within a sample. In this paper, we show the propensity of multiple CF to form within a variation of lateral and axial dimensions as well as different depths.

Conference Presentation

Citation Download Citation

Ambroise L. M. Juston, John F. Sevic, and Nobuhiko P. Kobayashi "A study on conducting filament formation in varying 3D memristive thin film using a phase-field model", Proc. SPIE 13114, Low-Dimensional Materials and Devices 2024, 1311404 (2 October 2024); https://doi.org/10.1117/12.3029802

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