Digital backplane liquid crystal on silicon devices (LCoS) are widely used in wavefront engineering applications due the maturity of the technology, thus the reliability of their performance. A thorough study of the relation between the different control parameters and their effect on the retardance modulation is lacking though. These control parameters, which are the low and high levels of the voltage signal together with the grey level addressed, in relation with the retardance modulation produced are explored across the whole visible spectrum. From a more practical point of view, this enables to decide which voltage parameters across the whole range of possibilities are the most appropriate for a certain wavefront engineering problem without the need to measure them in advance. Additionally, we are interested in the comparison of two different approaches developed in our research group to obtain the retardance modulation to see their possible pros and cons. The results presented are backed by the experimental measurements provided.
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