The Venus Emissivity Mapper (VEM): instrument design and development for VERITAS and EnVision

T. Hagelschuer; M. Pertenais; I. Walter; P. Dern; S. del Togno; T. Säuberlich; A. Pohl; Y. M. Rosas Ortiz; K. Westerdorff; E. Kopp; A. Fitzner; C. Arcos Carrasco; D. Wendler; B. Ulmer; C. Ziemke; S. Rufini Mastropasqua; H.-G. Lötzke; G. Alemanno; J. Carron; J.-M. Réess; A. C. Vandaele; S. Robert; E. Marcq; J. Helbert; G. Peter

doi:10.1117/12.3028082

3 October 2024 The Venus Emissivity Mapper (VEM): instrument design and development for VERITAS and EnVision

T. Hagelschuer, M. Pertenais, I. Walter, P. Dern, S. del Togno, T. Säuberlich, A. Pohl, Y. M. Rosas Ortiz, K. Westerdorff, E. Kopp, A. Fitzner, C. Arcos Carrasco, D. Wendler, B. Ulmer, C. Ziemke, S. Rufini Mastropasqua, H.-G. Lötzke, G. Alemanno, J. Carron, J.-M. Réess, A. C. Vandaele, S. Robert, E. Marcq, J. Helbert, G. Peter

Author Affiliations +

Proceedings Volume 13144, Infrared Remote Sensing and Instrumentation XXXII; 131440G (2024) https://doi.org/10.1117/12.3028082
Event: Optical Engineering + Applications, 2024, San Diego, California, United States

Abstract

We report on the current Venus Emissivity Mapper (VEM) instrument design and development status onboard NASAs Venus Emissivity, Radio science, InSAR, Topography, And Spectroscopy (VERITAS) and ESAs EnVision orbiters. The VEM instrument is a push broom multispectral imager that comprises an optical system based on a sophisticated filter assembly with 14 spectral bands and an InGaAs detector with integrated thermoelectric cooler. A turn window mechanism and a two-staged baffle in front of the optics protect the instrument against contamination and straylight. The instruments nominal mass is approximately 6 kg. VEM opens the path for mapping Venus surface emission with a global coverage of >70%.

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(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

T. Hagelschuer, M. Pertenais, I. Walter, P. Dern, S. del Togno, T. Säuberlich, A. Pohl, Y. M. Rosas Ortiz, K. Westerdorff, E. Kopp, A. Fitzner, C. Arcos Carrasco, D. Wendler, B. Ulmer, C. Ziemke, S. Rufini Mastropasqua, H.-G. Lötzke, G. Alemanno, J. Carron, J.-M. Réess, A. C. Vandaele, S. Robert, E. Marcq, J. Helbert, and G. Peter "The Venus Emissivity Mapper (VEM): instrument design and development for VERITAS and EnVision", Proc. SPIE 13144, Infrared Remote Sensing and Instrumentation XXXII, 131440G (3 October 2024); https://doi.org/10.1117/12.3028082

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