Lateral wave removal of time-of-flight diffraction based on peak detection and correlation analysis

Jiacheng Yao; Yunpeng Wang; Weizhi Tao; Zhangping Yan; Ninglei Lai; Aijun He

doi:10.1117/12.3031334

19 July 2024 Lateral wave removal of time-of-flight diffraction based on peak detection and correlation analysis

Jiacheng Yao, Yunpeng Wang, Weizhi Tao, Zhangping Yan, Ninglei Lai, Aijun He

Proceedings Volume 13181, Third International Conference on Electronic Information Engineering, Big Data, and Computer Technology (EIBDCT 2024); 131810C (2024) https://doi.org/10.1117/12.3031334
Event: Third International Conference on Electronic Information Engineering, Big Data, and Computer Technology (EIBDCT 2024), 2024, Beijing, China

Abstract

The Time of Flight Diffraction (TOFD) method stands as a highly efficient, cost-effective, and environmentally friendly approach for defect detection within the domain of ultrasonic testing. This method proves particularly efficacious in discerning weld seam defects within mechanical welded structures. The D-scan image assumes a pivotal role in detecting flaws within low-alloy thick plate butt welds. In D-scan images, a considerable portion of the data, under reasonable scanning depths, serves as background rather than conveying defect information. This background, primarily noise, acts as non-target interference and significantly disrupts defect identification. Particularly, when the probe detection angle approaches the surface, lateral waves emerge as relatively stable and continuously distributed noise in the image, characterized by trailing tails in time. This characteristic makes them susceptible to overlapping with signals from near-surface defects, resulting in blind spots during detection. To enhance the clarity of D-scan images, this paper introduces an expeditious and potent technique for lateral wave straightening and removal. the proposed method relies on the peak detection to A-scan and correlation analysis of A-scan signals for the meticulous rectification of D-scan signals. Moreover, it incorporates an insightful examination of image energy distribution and one-dimensional wavelet transform to effectively remove lateral waves, facilitating the generation of clear and discernible images of weld seam defects.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Jiacheng Yao, Yunpeng Wang, Weizhi Tao, Zhangping Yan, Ninglei Lai, and Aijun He "Lateral wave removal of time-of-flight diffraction based on peak detection and correlation analysis", Proc. SPIE 13181, Third International Conference on Electronic Information Engineering, Big Data, and Computer Technology (EIBDCT 2024), 131810C (19 July 2024); https://doi.org/10.1117/12.3031334

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
5 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Signal detection

Diffraction

Image filtering

Ultrasonics

Calibration

Defect detection

Wave propagation

Show All Keywords

Keywords/Phrases

Search In:

Publication Years