Calibration of the reflectivity-related error of the indirect time-of-flight imaging systems

Yi Luo; Ping Song; Yunjian Bai

doi:10.1117/12.3030643

3 June 2024 Calibration of the reflectivity-related error of the indirect time-of-flight imaging systems

Yi Luo, Ping Song, Yunjian Bai

Author Affiliations +

Proceedings Volume 13182, 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024); 131820U (2024) https://doi.org/10.1117/12.3030643
Event: 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024), 2024, Kunming, China

Abstract

The indirect time-of-flight imaging system possesses the characteristics of high real-time, high integration, and low cost, so it has a wide range of applications. However, the different reflectivity of the measured object will affect the change of the received signal, resulting in different degrees of depth error in the system. In this paper, we analyze the influence of reflectivity on the system, establish the reflectivity-related error model, and propose the error calibration method. The proposed method estimates the approximate reflectivity of the measured object through the range and amplitude information output by the system at first, Then the parameters of the error curve model are changed according to the obtained reflectivity, and the corresponding compensation is obtained. This method can select the corresponding compensation amount for objects with different reflectivity. The experimental verification shows that the method in this paper has a good effect on the calibration of reflectivity-related errors.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yi Luo, Ping Song, and Yunjian Bai "Calibration of the reflectivity-related error of the indirect time-of-flight imaging systems", Proc. SPIE 13182, 2024 International Conference on Optoelectronic Information and Optical Engineering (OIOE 2024), 131820U (3 June 2024); https://doi.org/10.1117/12.3030643

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KEYWORDS

Reflectivity

Distance measurement

Calibration

Error analysis

Imaging systems

Reflection

Signal intensity

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