Paper
5 July 2024 Research on aluminum profile surface defect detection based on an improved YOLOv5 algorithm
Liang Yang, Bo Liu, Lizhong Zhu
Author Affiliations +
Proceedings Volume 13184, Third International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024); 131840S (2024) https://doi.org/10.1117/12.3032930
Event: 3rd International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024), 2024, Kuala Lumpur, Malaysia
Abstract
As aluminum profiles become increasingly popular in aerospace and aircraft manufacturing, the detection and quality management of surface defects in aluminum profiles are crucial. This study enhances the YOLOv5 algorithm for detecting surface defects in aluminum profiles, using images from a company's production line. It introduces K-Means++ to the adaptive anchor box algorithm for optimal initial center selection in clustering. Additionally, C3 was replaced with C2f, and the SE attention mechanism was introduced. Experiments demonstrate that the optimized YOLOv5 algorithm performs excellently. It not only achieves faster detection speeds but also improves detection accuracy, effectively addressing the challenge of low recall rates for small and slender targets.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Liang Yang, Bo Liu, and Lizhong Zhu "Research on aluminum profile surface defect detection based on an improved YOLOv5 algorithm", Proc. SPIE 13184, Third International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024), 131840S (5 July 2024); https://doi.org/10.1117/12.3032930
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KEYWORDS
Aluminum

Defect detection

Object detection

Target detection

Manufacturing

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