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24 June 2024 Dark current and its effects analysis in a 1.4-cell RF photocathode gun at HUST ultrafast electron diffraction
Shuochun Yu, Jiapeng Li, Jian Wang, Jialian Zhang, Shuangxin Li, Chengying Tsai, Jinfeng Yang, Zhengzheng Liu, Kuanjun Fan
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Proceedings Volume 13209, 2nd International Conference on UltrafastX 2023; 1320905 (2024) https://doi.org/10.1117/12.3023410
Event: 2nd International Conference on UltrafastX 2023 (UX2023), 2023, Xi'an, China
Abstract
A 1.4-cell photocathode RF gun was developed for the MeV-UED to mitigate the space charge effect during electron emission through a higher acceleration gradient. However, this advancement introduces the risk of field-emitted dark current, leading to a degradation in the quality of the ultrafast electron beam. This paper investigates dark current emission within critical regions of the RF gun cavity. The results show that dark current electrons from the cathode and cathode edge escape from the electron gun, resulting in increased image background noise. The study examines the temporal characteristics of the dark current, including waveform in relation to the emission phase. Additionally, different collimator apertures are analyzed for their suppressive effect on the dark current, aiming to minimize its impact on the ultrafast electron beam.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Shuochun Yu, Jiapeng Li, Jian Wang, Jialian Zhang, Shuangxin Li, Chengying Tsai, Jinfeng Yang, Zhengzheng Liu, and Kuanjun Fan "Dark current and its effects analysis in a 1.4-cell RF photocathode gun at HUST ultrafast electron diffraction", Proc. SPIE 13209, 2nd International Conference on UltrafastX 2023, 1320905 (24 June 2024); https://doi.org/10.1117/12.3023410
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KEYWORDS
Dark current
Electron beams
Collimators
Field emission displays
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