In this paper, we propose a Low Voltage Trigger Silicon Controlled Rectifier (LVTSCR) device based on LVTSCR with Deep N-type well (DNW) isolation, realized by embedding reverse diode into the device, operating an additional parasitic PNP bipolar junction transistor (BJT) in the anode terminal and adding an extra N-well(NW)region. The proposed electrostatic discharge (ESD) protection device was developed through a 0.18μm Bipolar CMOS-DMOS (BCD) process. According to the analysis of TCAD simulation and measurement results of transmission line pulse (TLP) testing system, the LVTSCR embedded reverse diode reduces the slope of the reverse TLP I-V curve, which can effectively reduce the reverse conduction resistance. On the basis of the LVTSCR embedded reverse diode, when the additional parasitic PNP BJT operates in the anode terminal, the performance of this device is basically not affected. But the holding voltage of the LVTSCR embedded reverse diode can be improved by inserting additional NW with different widths in the P-well.
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