Research on self-test abnormalities and improvement techniques for discrete integrated chips

Jin Ji; Kui Chen; Li Ai

doi:10.1117/12.3039606

28 August 2024 Research on self-test abnormalities and improvement techniques for discrete integrated chips

Jin Ji, Kui Chen, Li Ai

Author Affiliations +

Proceedings Volume 13251, Ninth International Conference on Electromechanical Control Technology and Transportation (ICECTT 2024); 132511L (2024) https://doi.org/10.1117/12.3039606
Event: 9th International Conference on Electromechanical Control Technology and Transportation (ICECTT 2024), 2024, Guilin, China

Abstract

Discrete integrated chips are widely used in data acquisition systems due to their small size and large number of channels. In order to effectively collect discrete signals, it is necessary to test the integrated acquisition chip to check whether its function is normal. This article mainly analyzes the occasional discrete self-test anomaly of an embedded computer, analyzes the principle of the cause of the anomaly, investigates and locates the abnormal factors, and conducts chip testing and simulation analysis on the mechanism of the anomaly. Finally, by adding more testing items and screening vectors, the chip was rigorously screened and successfully solved the problem. This improvement measure provides important usage and testing support for the large-scale application of the discrete integrated chip

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Jin Ji, Kui Chen, and Li Ai "Research on self-test abnormalities and improvement techniques for discrete integrated chips", Proc. SPIE 13251, Ninth International Conference on Electromechanical Control Technology and Transportation (ICECTT 2024), 132511L (28 August 2024); https://doi.org/10.1117/12.3039606

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