Paper
27 September 2024 Study on characterization technology of metal phosphating layer
Xiao Yang, Yan Liu, Xuefeng Li, Zhihao Li, Hengpei Pan, Zhenzhong Wang, Lijuan Zhang, Xinyao Zhang, Lingqing Gao
Author Affiliations +
Proceedings Volume 13261, Tenth International Conference on Mechanical Engineering, Materials, and Automation Technology (MMEAT 2024); 1326130 (2024) https://doi.org/10.1117/12.3046956
Event: 10th International Conference on Mechanical Engineering, Materials, and Automation Technology (MMEAT 2024), 2024, Wuhan, China
Abstract
In this paper, the aluminum metal thin layer protective layer with a micron-sized was pre-evaporated on the surface of the phosphating layer sample by vacuum thermal evaporation. The presence of a metal aluminum layer can effectively prevent the diffusion between the inlay and the phosphate layer during sample preparation. Moreover, due to the bright color of the metal aluminum layer under the optical microscope, a bright strip can be formed on the phosphating layer, which can accurately locate the end point of the thickness measurement under the metallographic microscope and improve the accuracy of the thickness measurement. It can be shown that the thickness of the surface phosphating layer is about 8.047μm. And the result meets the designed technical index of phosphating layer thickness (≤10μm). Furthermore, the test characterization method can also provide indirect evidence for the uniformity of the phosphating layer.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Xiao Yang, Yan Liu, Xuefeng Li, Zhihao Li, Hengpei Pan, Zhenzhong Wang, Lijuan Zhang, Xinyao Zhang, and Lingqing Gao "Study on characterization technology of metal phosphating layer", Proc. SPIE 13261, Tenth International Conference on Mechanical Engineering, Materials, and Automation Technology (MMEAT 2024), 1326130 (27 September 2024); https://doi.org/10.1117/12.3046956
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Metals

Aluminum

Film thickness

Vacuum

Phosphates

Polishing

Particles

Back to Top