Using IR thermography for quantifying failure rates of electric power network components

Angel Madrid

doi:10.1117/12.23077

1 November 1990 Using IR thermography for quantifying failure rates of electric power network components

Angel Madrid

Proceedings Volume 1341, Infrared Technology XVI; (1990) https://doi.org/10.1117/12.23077
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

A technique based on IR Thermography measurements is proposed to estimate realistic values of electric hardware failure rates corresponding to secondary failures, that is, those caused by past or present out-of-tolerance or abnormal operating conditions. The technique allows the establishment of useful correlations between these failure rates, and the corresponding relevant thermal patterns as mapped using JR Thermography. The technique is applied to practical cases of secondary failures in typical AC and DC electric power network components having to do with failure modes due to abnormal stress, corrosion, and erosion. The application of this technique to fault and failure diagnosis, and both Reliability, Availability, and Maintainability (RAM) Analysis and Probabilistic Risk Assessment (PRA) of electric power networks is also briefly discussed.

Citation Download Citation

Angel Madrid "Using IR thermography for quantifying failure rates of electric power network components", Proc. SPIE 1341, Infrared Technology XVI, (1 November 1990); https://doi.org/10.1117/12.23077

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