Tapped delay line time-to-digital converters calibration based on Geiger-mode avalanche photodiode

Zhihan Jin; Jianjun Li; Wentao Wang; Huili Wang; Wenchao Zhai; Xiaobing Zheng

doi:10.1117/12.3046035

13 December 2024 Tapped delay line time-to-digital converters calibration based on Geiger-mode avalanche photodiode

Zhihan Jin, Jianjun Li, Wentao Wang, Huili Wang, Wenchao Zhai, Xiaobing Zheng

Author Affiliations +

Proceedings Volume 13498, AOPC 2024: Optoelectronics Testing and Measurement; 1349804 (2024) https://doi.org/10.1117/12.3046035
Event: Applied Optics and Photonics China 2024 (AOPC2024), 2024, Beijing, China

Abstract

Field Programmable Gate Array (FPGA) based Tapped Delay Line (TDL)- Time-to-Digital Converters (TDC) are widely used in photoelectric measurement due to flexible design and low cost. These types of TDCs require calibration to quantify the inconsistent bin width of the delay line for better accuracy. This paper proposes a code density method based on Geiger-Mode Avalanche Photodiode (GM-APD) avalanche signals for calibration. The paper analyzes the Poisson distribution of GM-APD’s avalanche signals. Then, using an experiment to verify that the proposed method is convenient and effective for TDL-TDC’s calibration, reduces the Differential Nonlinearity (DNL) and Integral Nonlinearity (INL) in measurement.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Zhihan Jin, Jianjun Li, Wentao Wang, Huili Wang, Wenchao Zhai, and Xiaobing Zheng "Tapped delay line time-to-digital converters calibration based on Geiger-mode avalanche photodiode", Proc. SPIE 13498, AOPC 2024: Optoelectronics Testing and Measurement, 1349804 (13 December 2024); https://doi.org/10.1117/12.3046035

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