Measurement of white light semiconductor laser junction temperature based on center-of-mass wavelength and integration width

Yongsheng Jiang; Lei Jing; Zhengrong Tong; Peng Li; Xue Wang; Hao Wang; Ye Tian; Zhonghan Wang

doi:10.1117/12.3054269

20 January 2025 Measurement of white light semiconductor laser junction temperature based on center-of-mass wavelength and integration width

Yongsheng Jiang, Lei Jing, Zhengrong Tong, Peng Li, Xue Wang, Hao Wang, Ye Tian, Zhonghan Wang

Author Affiliations +

Proceedings Volume 13515, Fourth International Conference on Advanced Manufacturing Technology and Electronic Information (AMTEI 2024); 1351510 (2025) https://doi.org/10.1117/12.3054269
Event: 4th International Conference on Advanced Manufacturing Technology and Electronic Information (AMTEI 2024), 2024, Chongqing, China

Abstract

Junction temperature is an important parameter affecting semiconductor lasers, and accurate and fast measurement of junction temperature is crucial for thermal design and performance inspection of semiconductor laser products. The spectra of white light semiconductor laser were measured under different driving currents and different ambient temperatures, and the effects of current and temperature on white light laser spectra were analyzed. Through the connection between junction temperature, driving current, center-of-mass wavelength, and integration width, the relationship graph of the four is constructed. The corresponding junction temperature can be obtained by combining the relationship graph with the characteristic parameters of the spectral distribution of the white light laser in the actual working state. The experimental results show that, compared with the peak wavelength method, the average error of the measurement of this method is 1.82 °C, which is a fast, accurate, low-cost and contact-free method for the measurement of the junction temperature of white light semiconductor laser.

(2025) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yongsheng Jiang, Lei Jing, Zhengrong Tong, Peng Li, Xue Wang, Hao Wang, Ye Tian, and Zhonghan Wang "Measurement of white light semiconductor laser junction temperature based on center-of-mass wavelength and integration width", Proc. SPIE 13515, Fourth International Conference on Advanced Manufacturing Technology and Electronic Information (AMTEI 2024), 1351510 (20 January 2025); https://doi.org/10.1117/12.3054269

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