Paper
1 August 1991 Comparison of plasma source with synchrotron source in the Center for X-ray Lithography
Jerry Z.Y. Guo, Franco Cerrina
Author Affiliations +
Abstract
The characteristics of sources for x-ray lithography are analyzed in terms of image formation. In particular, laser-induced plasma and synchrotron radiation sources are compared. New design considerations are presented for both types of sources, and we show that both can be good x-ray lithography sources in terms of image formation.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jerry Z.Y. Guo and Franco Cerrina "Comparison of plasma source with synchrotron source in the Center for X-ray Lithography", Proc. SPIE 1465, Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing, (1 August 1991); https://doi.org/10.1117/12.47377
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Photomasks

X-ray lithography

Plasma

Spatial coherence

Diffraction

Image acquisition

X-rays

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