Instant measurement of phase-characteristic curve

Lev S. Sadovnik; Chris C. Rich

doi:10.1117/12.50691

1 December 1991 Instant measurement of phase-characteristic curve

Lev S. Sadovnik, Chris C. Rich

Proceedings Volume 1559, Photopolymer Device Physics, Chemistry, and Applications II; (1991) https://doi.org/10.1117/12.50691
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

A fast method of diagnosing a phase characteristic curve for a variety of phase recording materials is proposed. A sinusoidal test pattern is printed onto a phase recording material that is illuminated through a continuous neutral density filter. The sample is then placed at the entrance of a 2-F coherent system, and the intensities of selected diffraction orders are observed. By comparison of the output intensity distribution with a predicted one, a curve of phase vs. exposure energy for the photosensitive material can be immediately calculated. This paper considers both surface relief modulation materials and volume optical index modulation media. Experimental measurements on DCG material show that extremely high input dynamic range (up to 3 orders of magnitude) can be obtained with standard processing.

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Lev S. Sadovnik and Chris C. Rich "Instant measurement of phase-characteristic curve", Proc. SPIE 1559, Photopolymer Device Physics, Chemistry, and Applications II, (1 December 1991); https://doi.org/10.1117/12.50691

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KEYWORDS

Phase measurement

Modulation

Phase shift keying

Photopolymers

Bessel functions

Chemistry

Diffraction

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