Effect of degradation modes on the lifetime assessment of GaAlAs/GaAs laser

Tibor F. Devenyi; George K. D. Chik; F. Yu

doi:10.1117/12.56860

1 February 1992 Effect of degradation modes on the lifetime assessment of GaAlAs/GaAs laser

Tibor F. Devenyi, George K. D. Chik, F. Yu

Proceedings Volume 1620, Laser Testing and Reliability; (1992) https://doi.org/10.1117/12.56860
Event: SPIE Technical: OPTCON '91, 1991, San Jose, CA, United States

Abstract

Degradation behaviors of GaAlAs/GaAs lasers have been studied and test results showed that the lasers degraded initially with a nearly constant rate of operating current increment followed by a rapid degradation mode. The time of onset of this latter mode differs for individual devices, but correlates well with the linear degradation rate at the start of lifetest. An analytic equation has been derived based on experimental data that covers a wide range of lifetimes, which could provide useful insight for the study of the possible mechanism responsible for the degradation behaviors, as well as for the development of a potential technique for reliability assessment of such lasers.

Citation Download Citation

Tibor F. Devenyi, George K. D. Chik, and F. Yu "Effect of degradation modes on the lifetime assessment of GaAlAs/GaAs laser", Proc. SPIE 1620, Laser Testing and Reliability, (1 February 1992); https://doi.org/10.1117/12.56860

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