Laser radar systems in the iron-making and steel-making environments

Andrew T. Paton; Ben A. Duval; R. J. Turner; Peter C. Wall

doi:10.1117/12.59215

1 June 1992 Relationship between the diffraction efficiency of a reflection hologram and the thickness and absorption of the recording medium

Andrew T. Paton, Ben A. Duval, R. J. Turner, Peter C. Wall

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Proceedings Volume 1633, Laser Radar VII: Advanced Technology for Applications; (1992) https://doi.org/10.1117/12.59215
Event: OE/LASE '92, 1992, Los Angeles, CA, United States

Abstract

The relationship between diffraction efficiency of a reflection hologram and the thickness and absorption coefficient of a recording medium was studied. The diffraction efficiency of a reflection hologram was found to increase monotonically with a decrease in the absorption coefficient (alpha) of the recording medium, but varies nonmonotonically with an increase of the thickness T of the recording medium. Maximum diffraction efficiency was obtained with T and (alpha) satisfied the relationship T equals 1/(alpha) . Finally, we suggest a method to improve the quality of reflection holograms.

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Andrew T. Paton, Ben A. Duval, R. J. Turner, and Peter C. Wall "Relationship between the diffraction efficiency of a reflection hologram and the thickness and absorption of the recording medium", Proc. SPIE 1633, Laser Radar VII: Advanced Technology for Applications, (1 June 1992); https://doi.org/10.1117/12.59215

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