Refractive index as a function of wavelength through spectrally resolved white light interferometry

C. Sainz

doi:10.1117/12.2308704

23 July 1993 Refractive index as a function of wavelength through spectrally resolved white light interferometry

C. Sainz

Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19837X (1993) https://doi.org/10.1117/12.2308704
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary

Abstract

In classical interferograms only one degree of freedom (shape of fringes) is utilized. There are, however, additional two degrees of freedom in every interferogram (intensity changes along fringes and fringe blurring) which can be used to record up to three sets of data into just one so-called complex interferogram. Possibilities of analyzing complex interferograms on personal computers are discussed.

Citation Download Citation

C. Sainz "Refractive index as a function of wavelength through spectrally resolved white light interferometry", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19837X (23 July 1993); https://doi.org/10.1117/12.2308704

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