Bias of integrated optics Pockels cell high-voltage sensors

Nicolas A.F. Jaeger; Farnoosh Rahmatian

doi:10.1117/12.166855

7 February 1994 Bias of integrated optics Pockels cell high-voltage sensors

Nicolas A.F. Jaeger, Farnoosh Rahmatian

Proceedings Volume 2072, Fiber Optic Physical Sensors in Manufacturing and Transportation; (1994) https://doi.org/10.1117/12.166855
Event: Optical Tools for Manufacturing and Advanced Automation, 1993, Boston, MA, United States

Abstract

The results of measurements of the intrinsic phase-differences of titanium- indiffused lithium niobate waveguides, for use in integrated optics Pockels cell high-voltage sensors, are presented. The dependencies of the intrinsic phase-differences of these waveguides on their lengths and widths are investigated; a change of between 4.9 and 5.9 degree(s)/micrometers /mm was obtained. Also, the change in the intrinsic phase-difference as a function of both temperature and time was investigated; a typical change of 0.02 degree(s)/ degree(s)C/mm was measured and, following a small initial change, the bias was found not to drift with time. Some suggestions for possible post-processing of the output signals, of the integrated optics Pockels cell high-voltage sensors, to increase the dynamic range and to compensate for small changes in the bias, are presented.

Citation Download Citation

Nicolas A.F. Jaeger and Farnoosh Rahmatian "Bias of integrated optics Pockels cell high-voltage sensors", Proc. SPIE 2072, Fiber Optic Physical Sensors in Manufacturing and Transportation, (7 February 1994); https://doi.org/10.1117/12.166855

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