Neutral thin film filters with low reflectivity for sensitometry

Evgeni B. Brik; L. A. Tkacheva; V. I. T'urnikova

doi:10.1117/12.166366

31 December 1993 Neutral thin film filters with low reflectivity for sensitometry

Evgeni B. Brik, L. A. Tkacheva, V. I. T'urnikova

Proceedings Volume 2161, CIS Selected Papers: Photometry; (1993) https://doi.org/10.1117/12.166366
Event: Photometry: Selected Papers from the 8th and 9th CIS Conferences, 1992, Moscow, Russian Federation

Abstract

Traditionally neutral light filters are made of glass (HC6, H7, HC8, etc.). There exists thin film technology for neutral-gray filters production with the use of vacuum evaporation on transparent glass substrates. To minimize residual reflectivity it is desirable to fulfill the following relation between refraction factor n of MgF₂ layer and optical conductivity Z of metal-dielectric mixture on the glass substrate: Z((lambda) ) n, where (lambda) - is a wavelength. It is shown, that to reduce dispersion of Z((lambda) ) in the visible it is necessary to use low thickness of metal layers in NTFF, that is of 3 to 5 nm.

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Evgeni B. Brik, L. A. Tkacheva, and V. I. T'urnikova "Neutral thin film filters with low reflectivity for sensitometry", Proc. SPIE 2161, CIS Selected Papers: Photometry, (31 December 1993); https://doi.org/10.1117/12.166366

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