Optical test method of HTSC structures for creating miniature elements and devices for the optical-instrument-building industry

I. V. Korotash; E. M. Rudenko

doi:10.1117/12.226164

3 November 1995 Optical test method of HTSC structures for creating miniature elements and devices for the optical-instrument-building industry

I. V. Korotash, E. M. Rudenko

Author Affiliations +

Proceedings Volume 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1995) https://doi.org/10.1117/12.226164
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1995, Kiev, Ukraine

Abstract

HTSC structures based on epitaxial YBCO films subjected to He-Ne laser irradiation have been studied. Two- and three-dimensional images of local resistive regions have been obtained. These give an opportunity to analyze the homogeneity of HTSC films.

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I. V. Korotash and E. M. Rudenko "Optical test method of HTSC structures for creating miniature elements and devices for the optical-instrument-building industry", Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); https://doi.org/10.1117/12.226164

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