Paper
27 May 1996 Manufacturing experience in reducing environmentally induced failure of laser diodes
Author Affiliations +
Abstract
Packaged life testing of laser diodes revealed a dramatic degradation of product lifetime. Failure analysis revealed the presence of carbon based compounds deposited on the emission regime causing catastrophic failure. This phenomenon was limited to packaged product. Testing was begun to identify the source, understand the mechanism, and initiate corrective action. Analysis revealed that the epoxy used in assembly was the dominate source of carbon. Contaminated epoxy had been introduced into production by a material batch change at the vendor. It was also learned that deposition only occurred in the dry, oxygen free atmosphere of a hermetically sealed package. It was necessary to develop incoming test procedures and process monitoring to ensure that material of acceptable quality was used. This paper will discuss test methods and results obtained in controlling this failure mechanism.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard A. Jollay "Manufacturing experience in reducing environmentally induced failure of laser diodes", Proc. SPIE 2714, 27th Annual Boulder Damage Symposium: Laser-Induced Damage in Optical Materials: 1995, (27 May 1996); https://doi.org/10.1117/12.240408
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Epoxies

Contamination

Carbon

Manufacturing

Semiconductor lasers

Atmospheric monitoring

Diodes

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