Paper
14 August 1997 Delayed luminescence emitted by the optical elements of the optoelectronic and laser systems
Alfons Planner, Danuta Frackowiak, J. Miyake
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Abstract
The delayed luminescence of the various glass and quartz plates as well as of deposited semiconducting and orientating layers was investigated. The shape of emitted delayed luminescence spectrum was different for various samples, but the intensity of this emission can not be neglected in the case of optical systems in which low intensity emission is investigated. Through the proper choice of the material and thickness of the plates, these perturbing effects can be diminished. The lowest delayed luminescence from investigated samples exhibits the quartz Suprasil SQ1. The delay luminescence is practically not diminished and the decrease in temperature from 295 K to 8 K shows that this emission is not generated with the participation of thermal energy.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alfons Planner, Danuta Frackowiak, and J. Miyake "Delayed luminescence emitted by the optical elements of the optoelectronic and laser systems", Proc. SPIE 3186, Laser Technology V: Physics and Research and Development Trends, (14 August 1997); https://doi.org/10.1117/12.280480
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KEYWORDS
Luminescence

Laser systems engineering

Optical components

Optoelectronics

Quartz

Glasses

Semiconductors

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