Cryo-analytical electron microscopy: new insight into the understanding of crystalline and electronic structure of silver halide

V. P. Oleshko; R. H. Gijbels; W. A. Jacob

doi:10.1117/12.301428

1 January 1998 Cryo-analytical electron microscopy: new insight into the understanding of crystalline and electronic structure of silver halide

V. P. Oleshko, R. H. Gijbels, W. A. Jacob

Author Affiliations +

Proceedings Volume 3347, Optical Information Science and Technology (OIST97): Optical Recording Mechanisms and Media; (1998) https://doi.org/10.1117/12.301428
Event: Optical Information Science and Technology, 1997, Moscow, Russian Federation

Abstract

Recent results of structural and analytical characterization of AgX (X equals Br, I) microcrystals of photographic emulsions by a number of cryo-analytical electron microscopy (AEM) and image analysis techniques are presented. Monte Carlo simulations of electron beam-AgX interactions have been made for a better understanding of relationships between various signals which can be analyzed in the corresponding AEM modes. Combined cryo-ESI/EDX multielement mapping was performed on AgX grain thin sections and on tabular AgX microcrystals. The contrast imaging under filtering with selected energy windows has been applied to image the morphology, crystal and defect structures of composite tabular AgX microcrystals. Extra reflections at commensurate positions in between the main Bragg reflections and weak diffuse intensity honeycomb contours caused by twins and/or {111} stacking faults in the shell region parallel to {112} grain edges and polyhedral clusters of Ag⁺ interstitials, respectively, were found in selected-area electron spectroscopic diffraction patterns. Low-loss collective excitations due to plasmons and excitons possibly superimposed with interband transitions and many- electron effects were revealed by cryo-EFTEM/EELS. The real and imaginary parts of dielectric permittivity were determined by means of a Kramers-Kronig analysis. Elemental inner shell edges of Ag and halides above 50 eV energy loss have been detected by EELS in accordance with cryo-STEM/EDX- analyses. The local crystal thickness was determined by a modified EELS log-ratio technique in agreement with measurements on grain replicas.

Citation Download Citation

V. P. Oleshko, R. H. Gijbels, and W. A. Jacob "Cryo-analytical electron microscopy: new insight into the understanding of crystalline and electronic structure of silver halide", Proc. SPIE 3347, Optical Information Science and Technology (OIST97): Optical Recording Mechanisms and Media, (1 January 1998); https://doi.org/10.1117/12.301428

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available