PROCEEDINGS VOLUME 3652
ELECTRONIC IMAGING '99 | 23-29 JANUARY 1999
Machine Vision Applications in Industrial Inspection VII
Editor(s): Kenneth W. Tobin Jr., Ning S. Chang
Editor Affiliations +
IN THIS VOLUME

5 Sessions, 28 Papers, 0 Presentations, 0 Posters
ELECTRONIC IMAGING '99
23-29 January 1999
San Jose, CA, United States
Systems and Process Characterization
Esa Makipaa, Juha T. Tanttu, Henri Virtanen
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341134
Wenyuan Xu, Steven P. Floeder
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341143
James S. Goddard Jr., Hamed Sari-Sarraf, John C. Turner, Martin A. Hunt, Besma R. Abidi
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341149
Image Processing and Metrology
Daoshan Yang, Jihong Chen, Huicheng Zhou, Shawn Buckley
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341150
Gaetan Delcroix, Denis Aluze, Fred Merienne, Bernard Lamalle, Patrick Gorria
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341151
Roberto Alencar Lotufo, Miguel Taube-Netto, Eduardo Conejo, Francisco Javier de Hoyos
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341152
Shang-Hong Lai, Ming Fang
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341125
Panagiotis Mitropoulos, Christos Koulamas, Radovan D. Stojanovic, Stavros Koubias, George D. Papadopoulos, George Karayanis
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341126
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341127
Yutaka Nakamura, Hitoshi Komoriya, Takao Hirahara, Tetsuo Koezuka
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341128
Color and Appearance
Alex M. Mumzhiu
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341129
Tsunehiro Aibara, Takehiro Mabuchi, Kenji Ohue
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341130
Martin A. Hunt, James S. Goddard Jr., Kathy W. Hylton, Thomas P. Karnowski, Roger K. Richards, Marc L. Simpson, Kenneth W. Tobin Jr., Dale A. Treece
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341131
Kazuo Yamaba
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341132
Damien Legeard, Pascale Marty-Mahe, Jean Camillerapp, Philippe Marchal, Claude Leredde
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341133
Guillaume Raffy, Pascale Marty-Mahe, Michel Ollivier, Philippe Marchal
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341135
Pattern Recognition
Shang-Hong Lai, Ming Fang
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341136
Songtao Li, Dongming Zhao, Jin Deng
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341137
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341138
Poster Session
Scott Burdette Anderson, Philip P. Dang, Paul M. Chau
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341139
Haisong Liu, Minxian Wu, Guofan Jin, Qingsheng He, Yingbai Yan
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341140
Normand Gregoire, Richard Lepage, Tanneguy Redarce
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341141
Luis Miguel Jimenez, Oscar Reinoso, Rafael Aracil, Fernando Torres-Medina, Jose M. Sebastian y Zuniga
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341142
Stephane Paquis, Vincent Legeay, Hubert Konik, Jean Charrier
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341144
David Garcia, Jose M. Sebastian y Zuniga, Francisco M. Sanchez Moreno, Luis Miguel Jimenez, J. M. Gonzalez
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341145
Image Processing and Metrology
Catherine W. Ni
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341146
Ning S. Chang
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341147
Pattern Recognition
Thomas F. Hospod
Proceedings Volume Machine Vision Applications in Industrial Inspection VII, (1999) https://doi.org/10.1117/12.341148
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