Miniaturization of speckle interferometry for rapid strain analysis

Ronny Wegner; Andreas Ettemeyer

doi:10.1117/12.364278

21 September 1999 Miniaturization of speckle interferometry for rapid strain analysis

Ronny Wegner, Andreas Ettemeyer

Proceedings Volume 3824, Optical Measurement Systems for Industrial Inspection; (1999) https://doi.org/10.1117/12.364278
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany

Abstract

Today's industry demands high-performance components meeting toughest mechanical features and ultimate safety standards. Especially in automotive and aircraft industry the development focuses on tailor-made design and solutions according to customer specifications. To reconcile economy, light-weight construction has become a key issue. Many companies are looking for new advanced strain/stress analysis techniques to improve cost efficiency and the limitations of classical methods. Detection of weak points and fatigue tests are carried out mainly with strain gauges which need careful application and experience. ESPI (electronic speckle pattern interferometry) allows a rapid, full field and 3D-measurement without contact. This paper presents the principle and application of a new miniaturized laser optical sensor combining contour and deformation measurement. In its basic employment ESPI is an interferometric method measuring deformations at modern working materials with high accuracy. Here also a module for contouring was developed and integrated into a single interferometer. Therefore even at complex components it is possible to measure and display strain-fields and -gradients with respect to the underlying contour. The new sensor is a unique device for flexible strain-analysis at welded-materials, extrusions, engines, car-bodies, etc. Without preparation and due to the full field and 3D- measurement 'hot spots' are shown, reducing the testing procedure and increasing the reliability of the complex component testing significantly. In this paper the recent development of a miniaturized ESPI-interferometer for strain and stress measurement is described. Advanced features according to classical techniques are specified and new applications in material and component testing are presented.

Citation Download Citation

Ronny Wegner and Andreas Ettemeyer "Miniaturization of speckle interferometry for rapid strain analysis", Proc. SPIE 3824, Optical Measurement Systems for Industrial Inspection, (21 September 1999); https://doi.org/10.1117/12.364278

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available