Microstructural studies of direct-overwrite (DOW) Ag-In-Sb-Te phase-change optical recording media

Samantha J. Price; A. L. Greer; C. E. Davies

doi:10.1117/12.399344

18 September 2000 Microstructural studies of direct-overwrite (DOW) Ag-In-Sb-Te phase-change optical recording media

Samantha J. Price, A. L. Greer, C. E. Davies

Proceedings Volume 4090, Optical Data Storage 2000; (2000) https://doi.org/10.1117/12.399344
Event: Optical Data Storage, 2000, Whistler, BC, Canada

Abstract

An understanding of the processes involved in direct overwriting (DOW) of phase-change optical recording media is vital in the development of new, and the improvement of existing, products. The present work investigates the microstructural and crystalline phase changes during overwriting of Ag-In-Sb-Te disks. Samples were prepared for observation in a transmission electron microscope from initialized disks written 1, 2, 10, 100 and 1000 times. After initialization, both bcc and fcc crystalline phases were observed, with a distinctive growth-dominated microstructure. After the first write (DOW(0)), a greater amount of the fcc phase was present within the groove, with an altered microstructure, against growth-dominated. A clear boundary between erased and as-initialized structures is observed. The second write (DOW(1)), produces a distorted mark shape, with a reduced amount of the fcc phase in the groove. After DOW (1000), again the mark shape is distorted, but now only the bcc remains within the groove. The phenomenon of jitter bump and the eventual failure of the disk are explained in terms of the differences in physical properties between these bcc and fcc crystalline phases.

Citation Download Citation

Samantha J. Price, A. L. Greer, and C. E. Davies "Microstructural studies of direct-overwrite (DOW) Ag-In-Sb-Te phase-change optical recording media", Proc. SPIE 4090, Optical Data Storage 2000, (18 September 2000); https://doi.org/10.1117/12.399344

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