Mueller matrix measurements of black and white materials in the infrared

Steven R. Meier; Richard G. Priest

doi:10.1117/12.406615

15 November 2000 Mueller matrix measurements of black and white materials in the infrared

Steven R. Meier, Richard G. Priest

Author Affiliations +

Proceedings Volume 4133, Polarization Analysis, Measurement, and Remote Sensing III; (2000) https://doi.org/10.1117/12.406615
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

We have investigated the degree of polarization (DOP) of infrared radiation reflected from rough white and black materials. Mueller matrices for these materials have been measured with an out-of-plane scatterometer with full polarization optics. We have compared the Mueller matrix data to the microfacet model. These results may have applications for stray light coatings for imaging polarimetric instruments.

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Steven R. Meier and Richard G. Priest "Mueller matrix measurements of black and white materials in the infrared", Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); https://doi.org/10.1117/12.406615

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