Processing application used in beam characterization

Wei Sun; Chunqing Gao; Guang Hui Wei

doi:10.1117/12.403897

10 October 2000 Processing application used in beam characterization

Wei Sun, Chunqing Gao, Guang Hui Wei

Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403897
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

CCD based laser beam characterization system is widely used in many experimental and industrial applications. Besides many factors of the CCD measurement system and the properties of the beams power density distributions to be measured, the obtained accuracy of laser beam characterization also strongly depends on the effectiveness of data processing algorithm. In this paper a Windows based processing application and its features and key processing algorithm are introduced and also a software related proposal is raised, such as common interface of measurement on simulated beam with given beam width, background and noise; universal image data storage format which would facilitate the international wide collaboration on the effectiveness evaluation of different processing application and system.

Citation Download Citation

Wei Sun, Chunqing Gao, and Guang Hui Wei "Processing application used in beam characterization", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); https://doi.org/10.1117/12.403897

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