Paper
6 October 2000 Feasibility study of a direct bonding technique for laser crystals
Akira Sugiyama, Hiroyasu Fukuyama, Yohei Kataoka, Akihiko Nishimura, Yukikatsu Okada
Author Affiliations +
Proceedings Volume 4231, Advanced Optical Manufacturing and Testing Technology 2000; (2000) https://doi.org/10.1117/12.402813
Event: International Topical Symposium on Advanced Optical Manufacturing and Testing Technology, 2000, Chengdu, China
Abstract
Direct bonding without the use of adhesives was demonstrated on Ti:sapphire laser crystals with a bonding surface of 12 mm x 6 mm and the bonded region was evaluated from the macroscopic to the atomic level by three different methods. Wavefront distortion caused by the bonded region of 10 mm x 5 mm was estimated at 0.031 wavelengths (λ) at 633 nm. Micro defect measurements by a laser tomography method showed that the number of micro defects on the bonded region were much smaller than that of the intrinsic ones inside the crystal. From a magnified inspection, atoms in the bonded region were well arranged with the same regularity as inside the crystal. In addition, micro defects 1 nm in size appeared slightly along the bonded interface where the titanium ion concentration was four times higher than other parts of the crystal.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Akira Sugiyama, Hiroyasu Fukuyama, Yohei Kataoka, Akihiko Nishimura, and Yukikatsu Okada "Feasibility study of a direct bonding technique for laser crystals", Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); https://doi.org/10.1117/12.402813
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Cited by 5 scholarly publications.
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KEYWORDS
Crystals

Laser crystals

Ions

Interfaces

Titanium

Aluminum

Adaptive optics

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