Frequency noise analysis of semiconductor lasers

Petr Jedlicka; Josef Lazar

doi:10.1117/12.417840

7 March 2001 Frequency noise analysis of semiconductor lasers

Petr Jedlicka, Josef Lazar

Proceedings Volume 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics; (2001) https://doi.org/10.1117/12.417840
Event: 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2000, Velke Losiny, Czech Republic

Abstract

For a fundamental etalon of optical frequency based on the external-cavity semiconductor laser (ECL), not only the long-term frequency stability but also the linewidth seems to be an important parameter. The linewidth broadening is dominated by fluctuations of the optical frequency. Parameters of these fluctuations and their spectral characteristics are crucial information for their suppression. We present an experimental setup for the frequency noise measurements designed for a free running 633 nm ECL with a stabilized reference He-Ne laser. We observed the corner frequency of the 1/f noise of the ECL of approximately 10 MHz. No significant spectral components over the 1/f noise corner frequency were found.

Citation Download Citation

Petr Jedlicka and Josef Lazar "Frequency noise analysis of semiconductor lasers", Proc. SPIE 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, (7 March 2001); https://doi.org/10.1117/12.417840

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