Optimum thickness of cubic photorefractive piezocrystal for diffraction efficiency

Yi Hu; Klaus H. Ringhofer; Ekaterina F. Shamonina; Alexander A. Firsov; Vasiliy V. Shepelevich

doi:10.1117/12.418843

15 March 2001 Optimum thickness of cubic photorefractive piezocrystal for diffraction efficiency

Yi Hu, Klaus H. Ringhofer, Ekaterina F. Shamonina, Alexander A. Firsov, Vasiliy V. Shepelevich

Proceedings Volume 4358, Optics of Crystals; (2001) https://doi.org/10.1117/12.418843
Event: Optics of Crystals, 2000, Mozyr, Belarus

Abstract

The analytical dependencies of crystal thickness, for which the diffraction efficiency optimized on the polarization angle reaches the maximum values, on the orientation angle are derived. It is shown that optimum thickness of the crystal is inversely proportional to its specific rotation and plots of dependence of crystal optimum thickness on the orientation angle are set of an equidistant curves with period 180 degree(s) corresponding different local maxima. A distance between these curves is defined by the specific rotation of the crystal (alpha) . The optimum thickness for the first local maximum can not be less than (pi) /(2(alpha) ). The magnitudes of crystal thickness, optimal for the diffraction efficiency of the hologram and gain coincide for some intervals of the orientation angle (theta) between the gating vector and direction [001]. Analytical expression, permitting to determine the azimuths of polarization of a reading light, at which the diffraction efficiency will be optimized simultaneously on the polarization angle and the crystal thickness, is found.

Citation Download Citation

Yi Hu, Klaus H. Ringhofer, Ekaterina F. Shamonina, Alexander A. Firsov, and Vasiliy V. Shepelevich "Optimum thickness of cubic photorefractive piezocrystal for diffraction efficiency", Proc. SPIE 4358, Optics of Crystals, (15 March 2001); https://doi.org/10.1117/12.418843

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