Paper
14 August 2001 Characterization of an analog self-electrooptic effect device with five photodetectors as an edge detector
C. J. Vianna, F. Yazdani, Eunezio A. de Souza
Author Affiliations +
Proceedings Volume 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications; (2001) https://doi.org/10.1117/12.437088
Event: IV Iberoamerican Meeting of Optics and the VII Latin American Meeting of Optics, Lasers and Their Applications, 2001, Tandil, Argentina
Abstract
We characterized an analog self-electrooptic effect device as an edge detector. The device consists of five input conventional photodiodes in series and a pair of quantum well modulators. In previous work, we demonstrated that this device was able to measure 2D spatial second order differentiation of an image. Here we demonstrated that this layout of photodiodes measure only images with spatial intensity profile at least quadratic.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. J. Vianna, F. Yazdani, and Eunezio A. de Souza "Characterization of an analog self-electrooptic effect device with five photodetectors as an edge detector", Proc. SPIE 4419, 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications, (14 August 2001); https://doi.org/10.1117/12.437088
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KEYWORDS
Photodetectors

Analog electronics

Modulators

Sensors

Quantum wells

Image processing

Edge detection

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