Paper
7 November 2002 (119) Bi-2223 thin films grown by MOCVD on (100) NdGaO3 and (110) SrTiO3
Kazuhiro Endo, P. Badica
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Abstract
In high temperature superconductors (HTS) the coherence length along non-c axis directions is longer. This feature can be useful wh en designing electronics devices based on HTS. Therefore growth and characterization of non-c axis oriented thin HTS films is of great interest. In this paper we present a short review of our data regarding (119) Bi-2223 thin films grown by MOCVD on (100) NdGaO3 and (110) SrTiO3. The emphasis is made on improvement and control of the quality of the films by the "two-temperature" technological approach and/or use of the vicinal substrates. Phase and morphology evolution for different processing conditions, substrate's type and off-angle are presented. The highest critical temperatures of Tc0=67.2 K and Tc0=74 K for the "single" and "two-"temperature routes were obtained on vicinal SrTiO3 with the off-angle of 20°. A higher off-angle promoted the formation of a specific step-like morphology with lower roughness. For the films grown on flat substrates the morphology was of mountain-range shape. Surface morphology as a result of two types of growth mechanisms (two-dimensional (2D), assisted by a so-called "twin"-growth and step-flow growth) for the (119)Bi-2223 filmes are discussed.
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Kazuhiro Endo and P. Badica "(119) Bi-2223 thin films grown by MOCVD on (100) NdGaO3 and (110) SrTiO3", Proc. SPIE 4811, Superconducting and Related Oxides: Physics and Nanoengineering V, (7 November 2002); https://doi.org/10.1117/12.457698
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Cited by 5 scholarly publications.
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KEYWORDS
Superconductors

Thin films

Metalorganic chemical vapor deposition

Thin film growth

Atomic force microscopy

Anisotropy

Scanning electron microscopy

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