Paper
23 January 2003 Update on lifetime tests results and analysis carried out on Thales Cryogenics integral coolers (RM family)
Jean-Marc Cauquil, Jean-Yves Martin, Peter Bruins, A.A.J. Benschop
Author Affiliations +
Abstract
The life time tests realised on the serial production of Rotary Mmonoblock RM2 coolers show a measured MTTF of 4900 hours. The conventional test profile applied to these coolers is representative of operation in typical application. The duration of such life time tests is very long. The results of a design change and its impact on MTTF are available only several months after the assembly of the prototypes. We decided to develop a test method in order to reduce the duration of these life time tests. The principle is to define a test protocol easy to implement, more severe than typical application profile in order to accelerate life time tests. The accelerated test profile was defined and tested successfully. This new technique allows us to reduce life time tests costs and duration and thus the costs involved. As a consequence, we decided to have a screening of our production with this accelerated test. This allows us to master continuously the quality of our serial products and to collect additional data. This paper presents the results of life time tests performed on RM2 coolers according to the conventional and accelerated test profiles as well as the first results on the new RM2 design which show a calculated MTTF of 10000 hours.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean-Marc Cauquil, Jean-Yves Martin, Peter Bruins, and A.A.J. Benschop "Update on lifetime tests results and analysis carried out on Thales Cryogenics integral coolers (RM family)", Proc. SPIE 4820, Infrared Technology and Applications XXVIII, (23 January 2003); https://doi.org/10.1117/12.451052
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Cited by 6 scholarly publications.
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KEYWORDS
Accelerated life testing

Cryogenics

Analytical research

Prototyping

Cryocoolers

Fluctuations and noise

Reliability

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