Paper
25 November 2002 Optimization of a cryogenic mirror stage
Author Affiliations +
Abstract
There is a current trend in space-based remote sensing toward long duration missions that produce hyper-spectral imaging data. One instrument that is uniquely suited to hyperspectral imaging is the infrared Michelson spectrometer. Michelson spectrometers use a translating mirror stage to vary the optical path length of one leg of the interferometer. Infrared applications often require cooling of this stage to achieve optimum performance. This cryogenic mirror stage is a critical spectrometer component that must be designed and constructed to achieve high reliability and performance during long duration missions. This paper concentrates on three specific areas of optimization. First, an accelerated lifetime test was performed on the mirror stage, with particular attention to the flexural pivots in the joints of the structure. There was no change seen over 22 million translation cycles. Second, a vibration model was created to predict the stage's response to launch and operational accelerations. The model's results closely matched measured values obtained during shake tests of the mirror stage. Third, a cryogenic mirror design was improved to decrease its weight and increase its stability over a wide temperature range. The improved design offers excellent performance for cryogenic operation.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard C. Robinson, Ronald J. Huppi, and Steven L. Folkman "Optimization of a cryogenic mirror stage", Proc. SPIE 4822, Cryogenic Optical Systems and Instruments IX, (25 November 2002); https://doi.org/10.1117/12.451776
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Cryogenics

Spectroscopy

Aluminum

Beryllium

Surface finishing

Temperature metrology

Back to Top