Paper
23 September 2003 Account for topological phases in interferometric measurements
V. A. Andreev, K. V. Indukaev
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Proceedings Volume 5067, Saratov Fall Meeting 2002: Laser Physics and Photonics, Spectroscopy, and Molecular Modeling III; Coherent Optics of Ordered and Random Media III; (2003) https://doi.org/10.1117/12.518611
Event: Saratov Fall Meeting 2002 Laser Physics and Photonics, Spectroscopy, and Molecular Modeling III; Coherent Optics of Ordered and Random Media III, 2002, Saratov, Russian Federation
Abstract
The structure of the phase arising when a probing light beam passes an optical system is analyzed. Its value is determined by the length of the optical path of the beam, by the geometry of the trajectory and by the optical properties of the reflecting surface. This phase is a sum of the linear phase, the Fresnel phase and the Rytov-Vladimirski phase. An interferometer measures the sum of all these separate phases. We propose a method to extract these separate phases from the total one and, therefore, determine the corresponding characteristics of the object. In the case of an isotropic object the explicit formulas are found. The device based on this approach combines the properties of both a profilometer and an ellipsometer.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. A. Andreev and K. V. Indukaev "Account for topological phases in interferometric measurements", Proc. SPIE 5067, Saratov Fall Meeting 2002: Laser Physics and Photonics, Spectroscopy, and Molecular Modeling III; Coherent Optics of Ordered and Random Media III, (23 September 2003); https://doi.org/10.1117/12.518611
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KEYWORDS
Polarization

Phase measurement

Interferometers

Interferometry

Phase interferometry

Optical spheres

Profilometers

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