Wavelets, curvelets, and multiresolution analysis techniques in fast Z-pinch research

Bedros Afeyan; Kirk Won; Jean-Luc Starck; Michael Cuneo

doi:10.1117/12.506243

13 November 2003 Wavelets, curvelets, and multiresolution analysis techniques in fast Z-pinch research

Bedros Afeyan, Kirk Won, Jean-Luc Starck, Michael Cuneo

Proceedings Volume 5207, Wavelets: Applications in Signal and Image Processing X; (2003) https://doi.org/10.1117/12.506243
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Z pinches produce an X ray rich plasma environment where backlighting imaging of imploding targets can be quite challenging to analyze. What is required is a detailed understanding of the implosion dynamics by studying snapshot images of its in flight deformations away from a spherical shell. We have used wavelets, curvelets and multiresolution analysis techniques to address some of these difficulties and to establish the Shell Thickness Averaged Radius (STAR) of maximum density, r*(N,θ) where N is the percentage of the shell thickness over which we average. The non-uniformities of r*(N,θ) are quantified by a Legendre polynomial decomposition in angle, θ, and the identification of its largest coefficients. Undecimated wavelet decompositions outperform decimated ones in denoising and both are surpassed by the curvelet transform. In each case, hard thresholding based on noise modeling is used.

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Bedros Afeyan, Kirk Won, Jean-Luc Starck, and Michael Cuneo "Wavelets, curvelets, and multiresolution analysis techniques in fast Z-pinch research", Proc. SPIE 5207, Wavelets: Applications in Signal and Image Processing X, (13 November 2003); https://doi.org/10.1117/12.506243

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KEYWORDS

Wavelets

Denoising

Wavelet transforms

Analytical research

Image compression

Infrared imaging

Image processing

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