Paper
17 August 2004 Design, testing, and calibration of an integrated Mach-Zehnder-based optical read-out architecture for MEMS characterization
Andrei Sabac, Christophe Gorecki, Michal Jozwik, Thierry Dean, Alain Jacobelli
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Abstract
While testing electrical properties in microsystems is a well-developed art, the testing of mechanical properties of MEMS devices is not. There is a great need for techniques that will allow the evaluation of MEMS devices, in all stages of manufacturing, with respect to material and micromechanical properties. In this contribution we propose a new approach, based on the integrated optical read-out using a Mach-Zehnder interferometer (MZI), monolithically integrated with the piezoelectric (PZT) actuated membrane.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrei Sabac, Christophe Gorecki, Michal Jozwik, Thierry Dean, and Alain Jacobelli "Design, testing, and calibration of an integrated Mach-Zehnder-based optical read-out architecture for MEMS characterization", Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); https://doi.org/10.1117/12.546299
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Cited by 6 scholarly publications.
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KEYWORDS
Waveguides

Geometrical optics

Microelectromechanical systems

Integrated optics

Ferroelectric materials

Silicon

Phase shifts

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