Noise of optoelectronic coupled devices

Alicja Krystyna Konczakowska; Jacek Andrzej Cichosz; Stanislaw Galla; Barbara Małgorzata Stawarz

doi:10.1117/12.547237

25 May 2004 Noise of optoelectronic coupled devices

Alicja Krystyna Konczakowska, Jacek Andrzej Cichosz, Stanislaw Galla, Barbara Małgorzata Stawarz

Proceedings Volume 5470, Noise in Devices and Circuits II; (2004) https://doi.org/10.1117/12.547237
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain

Abstract

The three systems for low frequency noise measurements of an optoelectronic coupled device (an infrared emitting diode and a phototransistor) were described. In the system I a low frequency noise of an infrared diode was measured, in the system II a low frequency noise of a phototransistor was measured, in the system III a low frequency noise of an optoelectronic coupled device was measured. The investigations were carried out for optoelectronic coupled devices of CNY type. The results of noise measurements in three systems are compared and a main source of noise in optoelectronic coupled devices was evaluated.

Citation Download Citation

Alicja Krystyna Konczakowska, Jacek Andrzej Cichosz, Stanislaw Galla, and Barbara Małgorzata Stawarz "Noise of optoelectronic coupled devices", Proc. SPIE 5470, Noise in Devices and Circuits II, (25 May 2004); https://doi.org/10.1117/12.547237

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