PROCEEDINGS VOLUME 5532
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING | 2-6 AUGUST 2004
Interferometry XII: Applications
Editor Affiliations +
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING
2-6 August 2004
Denver, Colorado, United States
Deformation and Motion Measurements I
Cosme Furlong, Ervin Kolenovic, Curtis F. Ferguson
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.562788
Jin Won Park, Jae Gun Jo, Sang Ho Byun, Jeong Eun Kim, Cheon Il Eom
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.563895
Deformation and Motion Measurements II
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560904
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.555969
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.562140
Yvette Houbrechts, Steve Roose, Yvan Stockman
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560734
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.557504
Precision Surface Characterization I
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560906
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.559893
Takaaki Miyashita, Kenjiro Hamanaka, Masahiko Kato, Satoshi Ishihara, Hiroyasu Sato, Eiichi Sato, Tadashi Morokuma
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.559872
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560383
Masahiko Kato, Takaaki Miyashita, Kenjiro Hamanaka, Satoshi Ishihara D.V.M., Eiichi Sato, Tadashi Morokuma
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.559837
Precision Surface Characterization II
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.558689
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.559722
Gunther Notni, Stefan Riehemann, Peter Kuehmstedt, Lars Heidler, Nancy Wolf
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560433
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560817
Zhongyu Wang, Ming Fang
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.561415
Distance, Displacement, and Angular Measurements
Volker Kebbel, Joachim Becker, Werner Jueptner
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.563322
Satoshi Gonda, Kazuto Kinoshita, Hironori Noguchi, Hajime Koyanagi, Tsuneo Terasawa
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.559173
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.555835
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.564236
Strain and Defect Characterization
Kay Gastinger, Gerd Guelker, Klaus D. Hinsch, Hans Magne Pedersen, Trude Storen, Svein Winther
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.561204
Leszek Salbut, Malgorzata Kujawinska, Eann Patterson, Erwin Hack, Richard Burguete, Maurice Patrick Whelan, David A. Mendels
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560939
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.555654
Maria del Socorro Hernandez-Montes, Fernando Mendoza Santoyo, Carlos Perez-Lopez
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.556090
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560273
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.555767
Industrial and In-situ Measurements
Nikhil H. Jalani, Shivananda P. Mizar, Pyoungho Choi, Cosme Furlong, Ravindra Datta
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.562893
Wolfgang Bauer, Alexander Moldenhauer
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560602
Rob K. Newsom, Robert D. Kaiser, August O. Schutte
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560501
Strain and Defect Characterization
Irina V. Semenova, Galina V. Dreiden, Alexander M. Samsonov
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.556315
Industrial and In-situ Measurements
Kai-Yu Cheng, Chung-Chi Tang, Wei-Cheng Chang, Chao-Jung Chen, Tsai-Fu Wu, Jung-Tsung Chou
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.559455
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560385
R. Lammegger, A. Huss, Laurentius Windholz, Ji Hua Xu
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560595
Jong Sup Song, Sergiy Shylo
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.557410
Deformation and Motion Measurements II
Igor V. Ershov, Alex P. Fedotov
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.557604
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.559560
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.560375
Precision Surface Characterization II
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.558939
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.561224
Industrial and In-situ Measurements
Proceedings Volume Interferometry XII: Applications, (2004) https://doi.org/10.1117/12.569806
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